Literature Review on Methods Used in Nano-Scaled Systems

This literature review explores methods used in nano-scaled systems, focusing on tele-nanorobotics, atomic force microscopes (AFM), and scanning tunneling microscopes (STM). It discusses the historical context of teleoperation, the advancements enabled by AFM and STM, and the principles behind these technologies. The review highlights the application of AFM for imaging and manipulation at the nanoscale, including the use of cantilevers and sensors. It also touches upon active magnetic levitation systems and the challenges in nanoscale manipulation, emphasizing the importance of non-contact imaging techniques. The paper concludes by reiterating the significance of these technologies in various applications, particularly in tele-nanorobotics, and provides a list of relevant references.

Literature Review 1
LITERATURE REVIEW
Name of Student
Institution Affiliation

Literature Review 2
METHODS USED IN NANO-SCALED SYSTEM TO ACT VERY SENSITIVE AND
ACCURATE
Since the ancient times, the teleoperation has been used to extend man's reach into the distance
or hostile environments. Usually, more sophisticated tools are required when, deep sea, nuclear
and large distance separation between the controlling function and the execution function are
carried out [1].Telerobotics systems that are applied in operating robots in hostile environments,
deep sea, and outer space have been of great focus as the field of teleoperations is concerned.
Apart from the mentioned applications, there are new applications that are emerging such as tele-
Nanorobotics. This type of applications has been made a reality by the discovery of the Scanning
Tunnel microscope and the Atomic force microscope which have the potential of providing
atomic size 3- D topology images. Even though the Nanoscale imaging technologies are being
developed, the nanoscale manipulation and the fabrication technologies are not developed [2].
Scanning tunneling microscope
Rohrer discovered the scanning tunneling microscope and it has created many opportunities for
the surface science which was carried at astounding resolutions, typically a few nm in the
vertical direction and approximately 0.2 nm in the lateral direction. The images were formed by
the raster scanning which is a very sharp metal tip over the sample [3]. Many promising variants
of the scanning tunneling microscope have been created, which include the development of the
Atomic force microscope. The scanning tunneling microscope can be used only for the purpose
of conducting samples of a small beam holding the scanning tip serves to create a force image of
the surface.
Atomic force microscope.

Literature Review 3
The atomic force microscope refers to the type of scanning probe microscope which makes
application of a fine prove over a surface rather than the use of electrons or a beam of light.T he
atomic force microscope yields 3D maps of the surfaces — usually there many types of scanning
probe microscope apart from the atomic force microscope, such as the near-field scanning
optical microscope . The atomic force microscope has a tip which can be modified in various
ways to investigate the surface properties, hence, a more improved version of the scanning
tunneling microscope which can image almost any kind of surfaces at a Nanoscale [4].
Working principles
The mechanism of the atomic force microscope is founded on the detection of the forces which
act between the sharp probe and the surface of the samples. The probe is typically referred to as
the atomic force microscope tip or the atomic force microscope sensor which is fixed to every
flexible cantilever. These are many techniques that are used in the detection of the motion of the
cantilever. Currently, many of the atomic force microscopes use laser beams detection, which is
an optical system. There are position sensitive detectors known as diodes. In this detectors, the
laser lights reflected from the cantilever onto the photo-diode. The atomic force microscope tips
and the cantilever are microfabricated from the silicon nitrides or silica, which should have the
near contact or contact with the surface of focus. Usually, minimal forces are created between
the surface and the probe through the surface, this kind of forces usually enables the atomic force
microscope system to record the deflection of the cantilever. The deflection of the cantilever is
referred to as ‘stiffness of cantilever’ the stiffness is measured by the Hooke law and is recorded
visually and can be easily visualized on the computer on the real time.
Active magnetic levitation systems

Literature Review 4
The active electromagnetic bearing has greatly offered frictionless support for the fast rotating
spindles which are usually used in vacuum machines and pumps centers. Electronic servo
regulators and narrow magnetic Gaps in these bearing offer a high stiffness. In the recent past, a
large gap electrodynamic levitation offering six degree –of –freedom frictionless motion with
programmable stiffness has since been introduced as a fine motion wrist [4].
Nanorobot and Sensor
A detailed AFM cantilever is usually applied for the Nano imaging and the manipulation. It is
usually a si cantilever which displays piezoresistive effect in a way that the cantilever is stressed
by any external force. Usually, the resistance of the cantilever is expected to change. Hence,
using a dc-biased Wheatstone bridge and assuming small deflections, the change of the
resistance can be converted into a voltage change such that;
Whereby is the time is the voltage change in the bridge output voltage, Vo
is the bridge supply voltage Gc =10000 or 100 is the gain in the amplifier, Sc is the sensitivity of
the cantilever to the resistance change per nm, and the is the cantilever deflection
from the rest position. The above equation can be applied in the conversion of the measured
voltage values into the nm deflection. Sc is the calculated experimentally by moving the
cantilever with the known displacement when the tip is at contact with the given sample.
The current system can be used to realize only the contact type of the AFM images.
Nevertheless, for manipulation applications, the Nano-objects to be manipulated are usually

Literature Review 5
designed not to be fixed on the substrate. Hence during imaging, contact – the type of scanning is
very undesirable, and in most cases tapping type or the non-contact of the AFM imaging is the
required [5].
Conclusion
In conclusion, Tele-robotics systems applied in operating robots in hostile environments, deep
sea, and outer space have been of great focus as the field of teleoperations. Apart from the
mentioned applications, there are new emerging applications such as tele-Nanorobotics. This
type of applications has been made a reality by the discovery of the Scanning Tunnel microscope
and the Atomic force microscope which have the potential of providing atomic size 3- D
topology images.
References
[1] M. S. a. H.Hashimoto, Tele-nanorobotics using atomic force microscope, London: Springer,
2015.
[2] M. a. H. Hashimoto, Macro to Nano telemanipulation through the nanoelectromechanical
system, Chicago: Springer Science & Business Media, 2012.
[3] A. m. a. P. T.R Ramachandran, Imaging and the direct manipulation of nanoscale three-
dimensional features using the non-contact atomic force microscope, Texas: Springer
Science & Business Media, 2014.
[4] K. a. T. M. Mitsuishi, Development of Tele-operated micro-handling /machining system
based on the information transformation, Istanbul: CRC press, 2011.
[5] S. a. D. A. R.L Hollis, Toward a Tele-Nanorobotics manipulation systems with the Atomic