SEM Analysis Report: Principles, Construction and Material Analysis

This report analyzes Scanning Electron Microscopy (SEM) images, focusing on a specific sample and its layered crystal structure with one-dimensional crystals. The report discusses the factors that influence SEM image quality, including accelerating voltage, magnification, and sample conductivity. It also details how to improve the image quality, such as adjusting resolution, using conductive materials, and working under appropriate vacuum conditions. The report references studies by Fauquet et al. (2011) and Yamamoto et al. (2010) to support the analysis and provides an overview of the construction of the SEM instrument, including the electron optical system, specimen stage, and image display unit. It highlights the importance of vacuum and the different components that contribute to producing an electron probe and scanning the sample. This analysis is particularly relevant for materials science and engineering students seeking to understand the principles and practical applications of SEM in material characterization.

Analyze your image.
The SM image has layered crystals therefore the material had a layered structure, it also clear it
has one dimensional crystal in a form of whiskers. The one dimensional cross-section observed
is a round square.
Factors that influence the SEM images (Yamamoto et al., 2010)
Accelerating voltage
The secondary electron resolution images would be improved when accelerating image
increased, whereas the quality of the image would become harder and specimen surface contrast
would decrease. It would be better if accelerating voltage would be changed accordingly to a
given spacemen.
Proper magnification
The current of a condenser lens would increase when the condenser lens would become bigger,
this would decrease the irradiation of specimen current.
Coating and Conductivity
The reason for coating and conductivity would be to increase the electrical conductivity of the
sample. High resistive material would cause dielectric breakdown on the specimen region, this
would result to dynamic and complex images artifacts.
How to get better SEM images (Fauquet et al., 2011)
Reducing resolution of the image would improve the apparent quality of the image of the sample,
this would happen when magnification would be lowered, and ensuring resolution setting are
moderate to ;lower noise that may reduce the image quality. When operating at high
magnification the opposite would be done to ensure quality image would be produced. When
dealing with non-conductive materials then it would be better if the material would be made
conductive and coated, or else work in a low vacuum at a variable pressure to negate the charge,
or work in a low voltage. Coating reduces electrostatic charge and as a result it improves the
image.

References
Fauquet, Carole, Maël Dehlinger, Franck Jandard, Sylvain Ferrero, Daniel Pailharey, Sylvia
Larcheri, Roberto Graziola et al. "Combining scanning probe microscopy and x-ray
spectroscopy." Nanoscale research letters 6.1 (2011): 308.
Yamamoto, Elcio, Juliana Marotti, Tomie Toyota de Campos, and Pedro Tortamano Neto .
"Accuracy of four transfer impression techniques for dental implants: a scanning electron
microscopic analysis." International Journal of Oral & Maxillofacial Implants 25.6 (2010).